prEN IEC 63470:2026
Guideline for gate oxide reliability and robustness evaluation procedures for silicon carbide power mosfets (Fast Track)
Draft Public enquiryProject stage codes
1. Decision on WI Proposal
2. Viešoji apklausa
From 2026-07-22
till 2026-09-20
Organisation
CENELEC Europos elektrotechnikos standartizacijos komitetasForeignTC'S
CLC/TC 47XNumber of comments
0Comment start date
2026-07-22