prEN IEC 63287-4:2025
Semiconductor devices - Guidelines for reliability qualification plans - Part 4: Early failure assessment
Draft Public enquiryProject stage codes
1. Decision on WI Proposal
2. Viešoji apklausa
From 2025-06-07
till 2025-08-06
Organisation
CENELEC Europos elektrotechnikos standartizacijos komitetasICS
31.080.01 - Semiconductor devices in generalForeignTC'S
CLC/TC 47XNumber of comments
0Comment start date
2025-06-07