prEN IEC 60749-24:2024
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased hast
Draft Public enquiryProject stage codes
1. Decision on WI Proposal
2. Viešoji apklausa
From 2024-09-13
till 2024-11-23
Organisation
CENELEC Europos elektrotechnikos standartizacijos komitetasICS
31.080.01 - Semiconductor devices in generalForeignTC'S
CLC/TC 47XNumber of comments
0Comment start date
2024-09-13Relations
Pakeis