prEN IEC 60749-26:2024
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Draft Archived
Comment end date
2025-02-02
Project stage codes
1. Decision on WI Proposal
2. Viešoji apklausa
From 2024-12-04
till 2025-02-02
Organisation
CENELEC Europos elektrotechnikos standartizacijos komitetasICS
31.080.01 - Semiconductor devices in generalForeignTC'S
CLC/TC 47XNumber of comments
0Comment start date
2024-12-04Relations
Pakeis