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projektai-lsd Lithuanian Standards Board
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prEN IEC 60749-29:2026

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Draft Public enquiry
Comment end date 2026-04-03
Export comments Read draft and comment

Project stage codes

1. Decision on WI Proposal
2. Viešoji apklausa
From 2026-02-02 till 2026-04-03

Organisation

CENELEC Europos elektrotechnikos standartizacijos komitetas

ICS

31.080.01 - Semiconductor devices in general

ForeignTC'S

CLC/TC 47X

Number of comments

0

Comment start date

2026-02-02

Relations

Pakeis
LST EN 60749-29:2011