prEN IEC 63608-1:2026
Semiconductor devices - Reliability test methods for vibration energy harvesters - Part 1: Mechanical reliability under shock
Draft Public enquiryProject stage codes
1. Decision on WI Proposal
2. Viešoji apklausa
From 2026-04-11
till 2026-06-10
Organisation
CENELEC Europos elektrotechnikos standartizacijos komitetasICS
31.080.99 - Other semiconductor devicesForeignTC'S
CLC/TC 47XNumber of comments
0Comment start date
2026-04-11