prEN IEC 63551-1:2026
Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 1: Combined LD-PD for LiDAR
Draft Public enquiryProject stage codes
1. Decision on WI Proposal
2. Viešoji apklausa
From 2026-09-23
till 2026-11-22
Organisation
CENELEC Europos elektrotechnikos standartizacijos komitetasICS
31.080.99 - Other semiconductor devicesForeignTC'S
CLC/TC 47XNumber of comments
0Comment start date
2026-09-23